"Insulator recognition based on mathematical morphology and Bayesian ..."

Fei Xia et al. (2017)

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DOI: 10.1109/CISP-BMEI.2017.8302063

access: closed

type: Conference or Workshop Paper

metadata version: 2018-03-07

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  dblp key:
  - conf/bmei/XiaTSZW17
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Fei Xia, Hai-feng Tie, En-wei Shi, Qian Zhang, Lei Wang:
Insulator recognition based on mathematical morphology and Bayesian segmentation. CISP-BMEI 2017: 1-5

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