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"Dynamic Behavior of Breakdown Mechanisms in SiGe HBTs."

Harrison P. Lee et al. (2021)

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DOI: 10.1109/BCICTS50416.2021.9682470

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  dblp key:
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  - https://dblp.org/rec/conf/bcicts/LeeTSC21
Harrison P. Lee, Jeffrey W. Teng, Nelson Sepúlveda-Ramos, John D. Cressler:
Dynamic Behavior of Breakdown Mechanisms in SiGe HBTs. BCICTS 2021: 1-4

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