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"Modeling the temperature dependence of sheet and contact resistances in ..."

Xiaodi Jin et al. (2020)

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DOI: 10.1109/BCICTS48439.2020.9392930

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  - conf/bcicts/JinWZS20
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Xiaodi Jin, Christoph Weimer, Yaxin Zhang, Michael Schröter:
Modeling the temperature dependence of sheet and contact resistances in SiGe: C HBTs from 4.3 to 423 K. BCICTS 2020: 1-4

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