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"Multi-Frequency Modular Testing of SoCs by Dynamically Reconfiguring ..."

Dan Zhao, Ronghua Huang, Hideo Fujiwara (2007)

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DOI: 10.1109/ATS.2007.79

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-09

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Dan Zhao, Ronghua Huang, Hideo Fujiwara:
Multi-Frequency Modular Testing of SoCs by Dynamically Reconfiguring Multi-Port ATE. ATS 2007: 107-110

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