"A Testability Improvement Method of Combinational Circuits Based on the ..."

Yang Zeng, Xiaole Cui (2024)

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DOI: 10.1109/ATS64447.2024.10915501

access: closed

type: Conference or Workshop Paper

metadata version: 2025-04-07

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Yang Zeng, Xiaole Cui:
A Testability Improvement Method of Combinational Circuits Based on the SDC Conditions. ATS 2024: 1-6

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