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"Non-Scan Design for Testability for Mixed RTL Circuits with Both Data ..."
Dong Xiang, Shan Gu, Hideo Fujiwara (2003)
- Dong Xiang, Shan Gu, Hideo Fujiwara:
Non-Scan Design for Testability for Mixed RTL Circuits with Both Data Paths and Controller via Conflict Analysis. Asian Test Symposium 2003: 300-305
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