"Memory test time reduction by interconnecting test items."

Wen-Jer Wu, Chuan Yi Tang (2000)

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DOI: 10.1109/ATS.2000.893639

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Wen-Jer Wu, Chuan Yi Tang:
Memory test time reduction by interconnecting test items. Asian Test Symposium 2000: 290-298

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