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"An Efficient Test Pattern Selection Method for Improving Defect Coverage ..."

Zhanglei Wang, Krishnendu Chakrabarty (2006)

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DOI: 10.1109/ATS.2006.260952

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-06

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Zhanglei Wang, Krishnendu Chakrabarty:
An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time. ATS 2006: 333-338

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