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"Adaptive Source Bias for Improved Resistive-Open Defect Coverage during ..."

Elena I. Vatajelu et al. (2013)

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DOI: 10.1109/ATS.2013.30

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/ats/VatajeluDBGTVB13
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Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing. Asian Test Symposium 2013: 109-114

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