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"Pre-silicon Noise to Timing Test Methodology."

Fern Nee Tan, Jia Yun Chuah (2020)

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DOI: 10.1109/ATS49688.2020.9301514

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-15

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  dblp key:
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Fern Nee Tan, Jia Yun Chuah:
Pre-silicon Noise to Timing Test Methodology. ATS 2020: 1-2

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