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"Cyclic greedy generation method for limited number of IDDQ tests."

Tsuyoshi Shinogi, Masahiro Ushio, Terumine Hayashi (2000)

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DOI: 10.1109/ATS.2000.893650

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Tsuyoshi Shinogi, Masahiro Ushio, Terumine Hayashi:
Cyclic greedy generation method for limited number of IDDQ tests. Asian Test Symposium 2000: 362-

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