"Non-robust Test Generation for Crosstalk-Induced Delay Faults."

Pei-Fu Shen et al. (2005)

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DOI: 10.1109/ATS.2005.81

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-11

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Pei-Fu Shen, Huawei Li, Yongjun Xu, Xiaowei Li:
Non-robust Test Generation for Crosstalk-Induced Delay Faults. Asian Test Symposium 2005: 120-125

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