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"On a Logical Fault Model H1SGLF for Enhancing Defect Coverage."
Junzhi Sang et al. (1998)
- Junzhi Sang, Tsuyoshi Shinogi, Haruhiko Takase, Terumine Hayashi:
On a Logical Fault Model H1SGLF for Enhancing Defect Coverage. Asian Test Symposium 1998: 102-107
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