BibTeX record conf/ats/SakataTSO99

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@inproceedings{DBLP:conf/ats/SakataTSO99,
  author    = {Takahide Sakata and
               Hideyuki Takahashi and
               Tetsu Sekine and
               Toshiya Ogiwara},
  title     = {Investigation of Ga Contamination Due to Analysis by Dual Beam {FIB}},
  booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
               China},
  pages     = {389--393},
  publisher = {{IEEE} Computer Society},
  year      = {1999},
  url       = {https://doi.org/10.1109/ATS.1999.810780},
  doi       = {10.1109/ATS.1999.810780},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/ats/SakataTSO99.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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