"An Optical/Electrical Test System for 100-Gb/s Optical Interconnection ..."

Takeshi Mizushima et al. (2016)

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DOI: 10.1109/ATS.2016.51

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Takeshi Mizushima, Kazuki Shirahata, Tasuku Fujibe, Hidenobu Matsumura, Daisuke Watanabe, Hiroyuki Mineo, Shin Masuda:
An Optical/Electrical Test System for 100-Gb/s Optical Interconnection Devices for High Volume Production. ATS 2016: 130

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