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"A DFT Selection Method for Reducing Test Application Time of System-on-Chips."
Masahide Miyazaki et al. (2003)
- Masahide Miyazaki, Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka, Hideo Fujiwara:
A DFT Selection Method for Reducing Test Application Time of System-on-Chips. Asian Test Symposium 2003: 412-417
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