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"Single-control testability of RTL data paths for BIST."

Toshimitsu Masuzawa et al. (2000)

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DOI: 10.1109/ATS.2000.893627

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Toshimitsu Masuzawa, Minoru Izutsu, Hiroki Wada, Hideo Fujiwara:
Single-control testability of RTL data paths for BIST. Asian Test Symposium 2000: 210-215

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