"Adaptive ECC Techniques for Yield and Reliability Enhancement of Flash ..."

Shyue-Kung Lu, Shang-Xiu Zhong, Masaki Hashizume (2016)

> Home

Details and statistics

DOI: 10.1109/ATS.2016.64

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/ats/LuZH16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/LuZH16
Shyue-Kung Lu, Shang-Xiu Zhong, Masaki Hashizume:
Adaptive ECC Techniques for Yield and Reliability Enhancement of Flash Memories. ATS 2016: 287-292

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.