"Complete Search in Test Generation for Industrial Circuits with Improved ..."

J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor (1998)

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DOI: 10.1109/ATS.1998.741616

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor:
Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection. Asian Test Symposium 1998: 212-

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