default search action
"Circuit Partitioned Automatic Test Pattern Generation Constrained by ..."
J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor (1996)
- J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor:
Circuit Partitioned Automatic Test Pattern Generation Constrained by Three-State Buses and Restrictors. Asian Test Symposium 1996: 29-33
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.