"Programmable Leakage Test and Binning for TSVs."

Yu-Hsiang Lin et al. (2012)

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DOI: 10.1109/ATS.2012.13

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yu-Hsiang Lin, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng:
Programmable Leakage Test and Binning for TSVs. Asian Test Symposium 2012: 43-48

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