"Scan Test Data Volume Reduction for SoC Designs in EDT Environment."

Guoliang Li et al. (2013)

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DOI: 10.1109/ATS.2013.27

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Guoliang Li, Jun Qian, Yuan Zuo, Rui Li, Qinfu Yang:
Scan Test Data Volume Reduction for SoC Designs in EDT Environment. Asian Test Symposium 2013: 103-104

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