"Combination Of Automatic Test Pattern Generation And Built-In Intermediate ..."

Kuen-Jong Lee et al. (1996)

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DOI: 10.1109/ATS.1996.555144

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kuen-Jong Lee, Jing-Jou Tang, Tsung-Chu Huang, Cheng-Liang Tsai:
Combination Of Automatic Test Pattern Generation And Built-In Intermediate Voltage Sensing For Detecting CMOS Bridging Faults. Asian Test Symposium 1996: 100-

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