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"TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random ..."
Youbean Kim et al. (2006)
- Youbean Kim, Dongsup Song, Kicheol Kim, Incheol Kim, Sungho Kang:
TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure. ATS 2006: 17-24
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