"Special ATPG to Correlate Test Patterns for Low-Overhead Mixed-Mode BIST."

Madhavi Karkala, Nur A. Touba, Hans-Joachim Wunderlich (1998)

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DOI: 10.1109/ATS.1998.741662

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Madhavi Karkala, Nur A. Touba, Hans-Joachim Wunderlich:
Special ATPG to Correlate Test Patterns for Low-Overhead Mixed-Mode BIST. Asian Test Symposium 1998: 492-499

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