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ORCID"An Effective At-Speed Scan Testing Approach Using Multiple-Timing Clock ..."
Hiroyuki Iwata et al. (2012)
- Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima, Masahiro Takakura:
An Effective At-Speed Scan Testing Approach Using Multiple-Timing Clock Waveforms. Asian Test Symposium 2012: 1
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