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"Critical-Area-Aware Test Pattern Generation and Reordering."
Shingo Inuyama, Masayuki Arai, Kazuhiko Iwasaki (2016)
- Shingo Inuyama, Masayuki Arai, Kazuhiko Iwasaki:
Critical-Area-Aware Test Pattern Generation and Reordering. ATS 2016: 191-196
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