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"High Quality Pattern Generation for Delay Defects with Functional ..."
Ming-Ting Hsieh et al. (2008)
- Ming-Ting Hsieh, Shun-Yen Lu, Jing-Jia Liou, Augusli Kifli:
High Quality Pattern Generation for Delay Defects with Functional Sensitized Paths. ATS 2008: 131-136
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