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"A Built-In Self-Diagnostic Mechanism for Delay Faults Based on ..."

Yushiro Hiramoto, Satoshi Ohtake, Hiroshi Takahashi (2019)

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DOI: 10.1109/ATS47505.2019.000-4

access: closed

type: Conference or Workshop Paper

metadata version: 2020-01-14

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Yushiro Hiramoto, Satoshi Ohtake, Hiroshi Takahashi:
A Built-In Self-Diagnostic Mechanism for Delay Faults Based on Self-Generation of Expected Signatures. ATS 2019: 31-36

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