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"Enhanced A/D Converter Signal-to-Noise-Ratio Testing in the Presence of ..."

Shalabh Goyal, Abhijit Chatterjee, Yanan Shieh (2006)

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DOI: 10.1109/ATS.2006.261036

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-07

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Shalabh Goyal, Abhijit Chatterjee, Yanan Shieh:
Enhanced A/D Converter Signal-to-Noise-Ratio Testing in the Presence of Sampling Clock Jitter. ATS 2006: 307-312

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