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"CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for ..."
Hiroshi Furukawa et al. (2008)
- Hiroshi Furukawa, Xiaoqing Wen, Kohei Miyase, Yuta Yamato, Seiji Kajihara, Patrick Girard, Laung-Terng Wang, Mohammad Tehranipoor:
CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing. ATS 2008: 397-402
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