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"Implementation of Defect Oriented Testing and ICCQ testing for industrial ..."

Liquan Fang et al. (2007)

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DOI: 10.1109/ATS.2007.93

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-09

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Liquan Fang, Yang Zhong, H. van de Donk, Yizi Xing:
Implementation of Defect Oriented Testing and ICCQ testing for industrial mixed-signal IC. ATS 2007: 404-412

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