"Practical Aspects of Delay Testing for Nanometer Chips."

Vivek Chickermane et al. (2005)

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DOI: 10.1109/ATS.2005.89

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Vivek Chickermane, Brion L. Keller, Kevin McCauley, Anis Uzzaman:
Practical Aspects of Delay Testing for Nanometer Chips. Asian Test Symposium 2005: 470

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