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"Test generation for fault isolation in analog circuits using behavioral ..."

Sasikumar Cherubal, Abhijit Chatterjee (2000)

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DOI: 10.1109/ATS.2000.893597

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sasikumar Cherubal, Abhijit Chatterjee:
Test generation for fault isolation in analog circuits using behavioral models. Asian Test Symposium 2000: 19-24

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