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"A Built-in Self-Test Scheme for Detecting Defects in FinFET-Based SRAM ..."
Meng-Chi Chen, Tsung-Hsuan Wu, Cheng-Wen Wu (2018)
- Meng-Chi Chen, Tsung-Hsuan Wu, Cheng-Wen Wu:
A Built-in Self-Test Scheme for Detecting Defects in FinFET-Based SRAM Circuit. ATS 2018: 19-24
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