"A Simplified Method for Testing the IBM Pipeline Partial-Scan Microprocessor."

Xinghao Chen et al. (1999)

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DOI: 10.1109/ATS.1999.810770

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Xinghao Chen, Thomas J. Snethen, Joe Swenton, Ron Walther:
A Simplified Method for Testing the IBM Pipeline Partial-Scan Microprocessor. Asian Test Symposium 1999: 321-326

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