"An Ultra-High-Speed Test Module and FPGA-Based Development Platform."

Te-Hui Chen, David C. Keezer (2016)

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DOI: 10.1109/ATS.2016.26

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Te-Hui Chen, David C. Keezer:
An Ultra-High-Speed Test Module and FPGA-Based Development Platform. ATS 2016: 269-274

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