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"A BIST Solution for the Functional Characterization of RF Systems Based on ..."
Manuel J. Barragan Asian et al. (2009)
- Manuel J. Barragan Asian, Rafaella Fiorelli
, Diego Vázquez, Adoración Rueda
, José Luis Huertas:
A BIST Solution for the Functional Characterization of RF Systems Based on Envelope Response Analysis. Asian Test Symposium 2009: 255-260
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