"Word-line batch Vth modulation of TLC NAND flash memories for both ..."

Yoshiaki Deguchi, Ken Takeuchi (2017)

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DOI: 10.1109/ASSCC.2017.8240241

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

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Yoshiaki Deguchi, Ken Takeuchi:
Word-line batch Vth modulation of TLC NAND flash memories for both write-hot and cold data. A-SSCC 2017: 161-164

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