"An on-chip characterizing system for within-die delay variation ..."

Xin Zhang et al. (2011)

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DOI: 10.1109/ASPDAC.2011.5722162

access: closed

type: Conference or Workshop Paper

metadata version: 2018-03-23

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Xin Zhang, Koichi Ishida, Makoto Takamiya, Takayasu Sakurai:
An on-chip characterizing system for within-die delay variation measurement of individual standard cells in 65-nm CMOS. ASP-DAC 2011: 109-110

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