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"Yield-aware time-efficient testing and self-fixing design for TSV-based 3D ..."

Jing Xie, Yu Wang, Yuan Xie (2012)

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DOI: 10.1109/ASPDAC.2012.6165053

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-07

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Jing Xie, Yu Wang, Yuan Xie:
Yield-aware time-efficient testing and self-fixing design for TSV-based 3D ICs. ASP-DAC 2012: 738-743

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