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"Learning Assisted Side Channel Delay Test for Detection of Recycled ICs."

Ashkan Vakil et al. (2021)

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DOI: 10.1145/3394885.3431640

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-09

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  dblp key:
  - conf/aspdac/VakilNMSK21
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  - https://dblp.org/rec/conf/aspdac/VakilNMSK21
Ashkan Vakil, Farzad Niknia, Ali Mirzaeian, Avesta Sasan, Naghmeh Karimi:
Learning Assisted Side Channel Delay Test for Detection of Recycled ICs. ASP-DAC 2021: 455-462

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