"Impact of Self-Heating on Performance, Power and Reliability in FinFET ..."

Victor M. van Santen et al. (2020)

Details and statistics

DOI: 10.1109/ASP-DAC47756.2020.9045582

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-09

a service of  Schloss Dagstuhl - Leibniz Center for Informatics