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"Temperature-independence-point properties for 0.1μm-scale ..."

Kazuya Hisamitsu et al. (2003)

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DOI: 10.1145/1119772.1119807

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/aspdac/HisamitsuUTKMMKYYN03
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  - https://dblp.org/rec/conf/aspdac/HisamitsuUTKMMKYYN03
Kazuya Hisamitsu, Hiroaki Ueno, Masayasu Tanaka, Daisuke Kitamaru, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama:
Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design. ASP-DAC 2003: 179-183

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