"On Decomposing Complex Test Cases for Efficient Post-silicon Validation."

C. Harshitha et al. (2024)

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DOI: 10.1109/ASP-DAC58780.2024.10473813

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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C. Harshitha, Sundarapalli Harikrishna, Peddakotla Rohith, Sandeep Chandran, Rajshekar Kalayappan:
On Decomposing Complex Test Cases for Efficient Post-silicon Validation. ASPDAC 2024: 256-261

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