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"Post-silicon bug detection for variation induced electrical bugs."

Ming Gao, Peter Lisherness, Kwang-Ting (Tim) Cheng (2011)

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DOI: 10.1109/ASPDAC.2011.5722197

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-07

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  dblp key:
  - conf/aspdac/GaoLC11
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  persistent URL:
  - https://dblp.org/rec/conf/aspdac/GaoLC11
Ming Gao, Peter Lisherness, Kwang-Ting (Tim) Cheng:
Post-silicon bug detection for variation induced electrical bugs. ASP-DAC 2011: 273-278

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