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"The study of parameters variation of nMOSFET affected by the HCI."

Xiaowen Zhang, Xiaoling Lin, Rui Gao (2021)

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DOI: 10.1109/ASICON52560.2021.9620384

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-06

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  dblp key:
  - conf/asicon/ZhangLG21
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  - https://dblp.org/rec/conf/asicon/ZhangLG21
Xiaowen Zhang, Xiaoling Lin, Rui Gao:
The study of parameters variation of nMOSFET affected by the HCI. ASICON 2021: 1-4

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