"Machine Learning-Assisted Single-Event Transient Model of 12nm FinFETs for ..."

Jianwen Lin et al. (2023)

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DOI: 10.1109/ASICON58565.2023.10396190

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-16

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Jianwen Lin, Linlin Cai, Yutao Chen, Haoyu Zhang, Wangyong Chen:
Machine Learning-Assisted Single-Event Transient Model of 12nm FinFETs for Circuit-Level Simulation. ASICON 2023: 1-4

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