"New DfT architectures for 3D-SICs with a wireless test port."

Yibo He et al. (2013)

Details and statistics

DOI: 10.1109/ASICON.2013.6812017

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-07

a service of  Schloss Dagstuhl - Leibniz Center for Informatics