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"Building-in reliability in BCD (Bipolar-CMOS-DMOS) technologies."

Jifa Hao, T. E. Kopley (2013)

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DOI: 10.1109/ASICON.2013.6811954

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Jifa Hao, T. E. Kopley:
Building-in reliability in BCD (Bipolar-CMOS-DMOS) technologies. ASICON 2013: 1-4

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